Capacitor high temperature aging test rig

[Test criteria]

The test lines and test methods of this system are in accordance with the GJB360 requirements of the national military standard.

[Scope of application]

Suitable for all kinds of axial, radial, surface-mounted tantalum capacitors, ceramic capacitors for high-temperature high-voltage aging test.

[Control model]

1. The computer program control mode, the main control computer adopts the   high reliable standard industrial computer or according to the demand request to configure the standard commercial computer;

2. Windows operating system special software, Windows-like graphical user interface;

3. Screen LCD display, standard industrial computer keyboard, mouse operation.

[high-temperature test chamber]

1. The temperature control range of the test chamber is as follows: ambient  temperature ~ 150 ℃, temperature control accuracy: ±1 ℃, temperature uniformity: ±3 ℃, specific reference to the factory indexes of five Guangzhou products, the accuracy of temperature control is: ±1 ℃, the temperature uniformity is ±3 ℃.

2. Upper computer temperature monitoring, overtemperature alarm system, when the temperature of the test chamber exceeds the set temperature, automatic sound alarm and cut off the power supply of the high temperature testing chamber or the whole machine power supply; Avoid the damage caused by the temperature fluctuation or out of control of the high temperature test chamber, and make the test chamber work in the multi-protection state;

3. The temperature of the test chamber is recorded and the temperature-time curve of the chamber is drawn in real time. The temperature of the high temperature chamber is monitored in real time during the whole test process to prevent the device failure due to the fluctuation of the temperature in the chamber.

[Aging test power supply] (configured according to user requirements)

1. Configuration of 400V/1A total 2-way aging test power supply, can simultaneously aging one type of capacitor with different test voltage, each 1-way power supply corresponding to supply of capacitor aging test board power input relationship see the following table:

2. Each power supply can be constant voltage, constant current, with over-voltage, over-current, short-circuit, overheating and other protection functions.

[Detection control board]

1. The whole machine is equipped with 16 pieces of control and detection board;

2. Each control board is independently controlled by a set of single-chip microcomputer, corresponding to the control of an aging test board (test channel);

3. Each control test board independently manages the aging test channel, controls the test state and the test process of the test channel;

4. On-line real-time detection of all stations leakage current, real-time detection results whether or not to exceed the set upper limit, if exceeded, record alarm stations;

5. The failure station of short circuit breakdown is detected in real time and the station is separated from the aging loop.

6. Each test automatically controls the charge and discharge of the capacitor to ensure the complete discharge of the capacitor at the end of the test;

7. Leakage current detection range: 1.0uA / 20.0mA, resolution and sampling accuracy are as follows:

(1) 1.0~99.9uA resolution is 0.1uA, accuracy: 2% ±2LSB

(2) 100~999uA resolution is 1UA, accuracy: 2% ±2LSB

(3) 1.0mA~20.0mA resolution is 0.1mA, accuracy: 2% ±2LSB

8. Aging voltage detection range: 0V / 2000V, precision: ±2% ±2LSB

9. Charge resistance 1K Ω, charge-discharge time can be set.

[Aging test area]

1. The whole machine adopts the control mode of one board and one zone, that is, 16 control boards controlled independently by single-chip microcomputer, and 16 test channels are controlled one by one.

2. Each test channel is composed of an aging test board and a test control board.

3. According to the configuration of aging test power supply, a number of different voltage test areas are provided.

[Aging test board]

1. According to the requirements of the supplier, the capacitor variety design and processing of the aging test board shall be carried out in accordance with the requirements of the supplier.

2. Capacitor aging test board generally has radial, axial, surface type and other packaging forms;

3. Different packaging forms of capacitors corresponding to the need for different old refining plate;

4. When the diameter of the capacitor in radial packaging varies greatly, different old refining plates are required.

5. Chip package capacitor electrode distance between different correspondence needs different old refining plate.

[Test station]

1. The maximum number of test stations for each old test board is 565;

2. At the same time, the whole machine can insert 20 test boards, a total of 56 / block × 16 = 896 test stations;

3. Through parallel aging test, in order to greatly increase the aging test station;

4. The number of test stations is related to the shape of the tested capacitor. The larger the appearance volume, the test station shall be reduced correspondingly. See the specification of the old test board for details.。

[Operational software]

1. The whole machine control system adopts the communication mode of upper and lower computer. The upper computer (industrial control computer) communicates with 16 sets of lower computer (single chip microcomputer) through the standard RS485 interface.

2. It has the functions of editing, recording, storing and so on, which makes it easy to call and inquire.

3. The aging time of each test channel can be set within 10 minutes ~ 9000 hours. After aging, the device alarm and remind manual control to end the aging, or according to the alarm time set, the alarm end will automatically turn off the power supply and load, and end the aging.

4. Real-time display of the charge and discharge process of the tested capacitor to ensure the safety of the test;

5. Automatically / manually locate or test the test parameters of each old channel, record, save data and form a database;

6. Set the upper limit of leakage current of the old capacitor in each test area, and display the corresponding station number in the distribution chart of the out-of-limit capacitor;

7. The leakage current and test voltage of each station are described dynamically, the temperature-time curve of the test chamber is described, and the test parameters of all test stations at a certain time are checked at any time.

8. Set the detection interval time during the test process, monitor the voltage of the old power supply of each board and the temperature of the test chamber, and record the time of failure.

9. Real-time inquiry of the status of the plug-in plate of the old refining plate;

10. Aging pause and continue control and other functions;

11. Save all the test information, test results form a report, easy to statistics, analysis.

For more information about products, please contact us and visit the company.

Address: Tianhui Road, Wisdom City, Tianhe District, Guangzhou

Tel: 86-20-37896688

Fax:86-20-37896699

Mobile phone: 86-13711272581,Miss Liu

Web site: