IEC60884-1 Test Probes for Socket-outlet no-accessibility of live parts test gauges through shutters
USD $60 - $500 /Piece
Min.Order:1 Piece
Pego Electronics (Yi Chun) Company Limited
1. Introduction
The probes are designed according to IEC60884-1 figure 9 and figure 10 and VDE0620-1 Lehre 13 and lehre 15. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection.
2. Parameter
20N Push force | Rigid steel wire | Diameter: 3+0.03mm, length: 80±0.5mm |
Tip of rigid steel wire | R0.2+0.05 | |
1N Push Force | Rigid steel wire | Diameter: 1+0.015mm, length: 80±0.5mm |
Tip of rigid steel wire | R0.05 |