IEC60335-1 Fingernail Test Probe with 50N Thruster
1. Introduction
The finger nail test probe is designed according to IEC60335-1 figure 7, and meet the test requirements of IEC60335-1 clause 21.2 and clause 22.11, the test is applied after the scratch test. Test finger nail is mainly used for the puncture-proof test of the accessible part of the solid insulation, also it is used to test whether the non-removable parts of an electric shock or release moving part are able to withstand the mechanical stresses that occur during normal use.
2. Application
a) Applied 10N force to the surface of scratch test, the material of the scratched surface cannot be separated.
b) Use the test finger nail to insert any gap or joint, apply a 10N side force vertically, but do not to twist and sway, the relevant parts can not fall off or damage.
C). If the shape of the part is such that an axial pull is unlikely, the pull force is no applied but the test fingernail is inserted in any aperture or joint with a force of 10N and is then pulled for 10s by means of the loop with a force of 30N in the direction of removal，the relevant parts can not fall off or damage.
3. Specification:
Nail component | Finger tip, middle finger and finger stand |
Force | 10N, 20N, 30N, 40N, 50N |
Standard | IEC60335-1 figure 7, GB4706.1 figure 7 |
