Description
JOEO horizontal thermal shock test chamber,horizontal thermal shock machine,thermal cycling chambers,thermal cycle test chamber are ideal for batch testing and larger test loads. The chamber is designed for custom environmental stress screening of components and board level electronic components. The carrier basket transfers the load between the hot and cold zones in a two - or three-zone configuration. In the horizontal three zones, the product moves through the carrying basket between the cold zone and the environmental zone, and the hot zone moves to surround the carrying basket.

A dual-effect thermal test systems (DTS) consists of three zones: a hot chamber at each end and a cold chamber in the middle. This design allows products to be moved between areas simultaneously through two product baskets - exposing twice as much product in one system to maximize your investment.

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Feature

• The reference test load of the JOEO temperature shock chamber is composed of 12 steel plates. Each pound of steel has an exposed surface area of 65 square inches. The test load is oriented in the product carrier, with the airflow parallel to the steel plate. The load is distributed between two product carriers.

• The weight of any additional racks must be included in the test load shown above.

• The capacity depends on the stability of the product at extreme temperatures before transfer. Do not use environment dwell time.

• When assisted by liquid nitrogen, smaller mechanical refrigeration systems will maintain low temperatures. Liquid nitrogen is required to meet the recovery time.

• For a liquid nitrogen only thermal chambers, the maximum load is liquid nitrogen cooling without mechanical cooling.

• Use IC chip product loading to recover 9 point products in 15 minutes or less. The load is distributed between two product carriers.