Semiconductor alloy films devices research Atomic Force Microscope
Semiconductor alloy films devices research Atomic Force Microscope
Semiconductor alloy films devices research Atomic Force Microscope
Semiconductor alloy films devices research Atomic Force Microscope
Semiconductor alloy films devices research Atomic Force Microscope

Semiconductor alloy films devices research Atomic Force Microscope

Negotiable

Min.Order:1

Supply Ability:
1000 per Month
Payment Terms:
T/T Credit Card

Nanbei Instrument Limited

Business Type: Distributor/Wholesaler
Main Products: , , ,

Product Details

Semiconductor alloy films devices research Atomic Force Microscope

Product Description
 

All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer’s requirements in accuracy and scan size;optical observation system for tip check and sample positioning.CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.
 

Characteristic
 

1.Multi-channels images are capture and display synchronous, observe profile map in real time.
2.Obtain and measure many curves such as F-Z, f-RMS, RMS-Z
3.Execute scan area move and cut function, choose any interesting area of sample.
4.Scan sample in random angle at beginning.
5. Adjust the laser spot detection system in real time. 
6. Search the resonance frequency of tip manually or automatically.
7. Choose and set different color of scanning image in palette.
8. Support linear average and offset calibration in real time for sample title.
9. Support scanner sensitivity calibration and electronic controller auto-calibration.

 

 

Technical parameter
 

 

Item

Technical data

Item

Technical data

Operation modes

Contact mode,

 Tapping mode

Scan angle

0~360 °

Sample size

Φ≤80 mm;H≤20 mm

Sample movement

0~20 mm

Max. scan range

X/Y: 50 um, Z: 5 um

Pulse width of approaching  motor

10±2 ms

Resolution

X/Y: 0.2 nm, Z: 0.05nm

Magnification of CCD

Optical magnification:0.6~5X, 

Electronic magnification: 40X

Scan rate

0.6 Hz~4.34 Hz

Data points

256×256,512×512

Scanning control

XY: 18-bit D/A, Z: 16-bit D/A

Feedback type

DSP digital feedback

Data sampling

One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously 

Feedback sampling rate

64.0KHz

Weight/Size

40KG,700*480*450mm

PC connection

USB2.0

Windows

Compatible with Windows98/2000/XP/7/8

 

Detailed Images
 

Semiconductor alloy films devices research Atomic Force Microscope

                                          

Semiconductor alloy films devices research Atomic Force MicroscopeSemiconductor alloy films devices research Atomic Force MicroscopeSemiconductor alloy films devices research Atomic Force MicroscopeSemiconductor alloy films devices research Atomic Force Microscope

Semiconductor alloy films devices research Atomic Force Microscope

 

Research on Nanomaterials

Semiconductor alloy films devices research Atomic Force Microscope

Research on Ancient Ceramics

Semiconductor alloy films devices research Atomic Force Microscope

Research on Friction Materials

Semiconductor alloy films devices research Atomic Force Microscope

 

Packaging & Shipping

Shipping : 3-10days after payment received

Package : Standard export package

Semiconductor alloy films devices research Atomic Force Microscope

FAQ

1. How can I choose the suitable one?

Dear customer, please tell us your detailed requirements by mail or online, we will recommend the suitable one as your request.

 

2. Does your price is competitive?

Dear customer, we make sure to offer you the best quality with competitive price.

 

3. How can I pay?

Dear customer, we accept many payment term, such as T/T, Western Union…

 

4. When I receive it after pay?

Dear customer, normal models can be delivered with 5-7days, please contact us to check transport time to your address.

 

5. How to deliver?

Dear customer, we can send by Express, by Sea and by Air.

 

6. Is will be broken during transport?

Dear customer, please do not worry, we do standard export package.

 

7. What should I do if I do not know how to use?

Dear customer, please do not worry, manual user will be sent together, you can also contact us with more technological support.

 

8. What should I do if some parts broken?

Dear customer, please do not worry, we have 12months warranty except  wear parts. You can also buy parts from us after 12months

Our Company

Semiconductor alloy films devices research Atomic Force MicroscopeSemiconductor alloy films devices research Atomic Force Microscope 

Contact Person

Semiconductor alloy films devices research Atomic Force Microscope

Please feel free contact for more details .Thanks

Contact Supplier

You May Like

New Products

Recommended Products

View More View Less

Find Similar Products By Category

Measurement & Analysis Instruments > Optical Instruments > Microscopes
Categories
Hi~