DW-XRD-Y3000 xrd x-ray diffraction

DW-XRD-Y3000 xrd x-ray diffraction

USD $12,000 - $75,000 /Piece

Min.Order:1 Piece

Supply Ability:
200 Piece / Pieces per Month
Port:
Shanghai
Payment Terms:
T/T Credit Card

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Brand Name:
DRAWELL
Place of Origin:
Shanghai, China
Model Number:
DW-XRD-Y3000
Size:
1100x 850 x1750mm
Weight:
840KG
Measurement Range:
5-80mA

Shanghai Drawell Scientific Instrument Co., Ltd.

Business Type: Association
Main Products: Spectrophotometer ,Environmental Analyser

Product Details

DW-XRD-Y3000 Model X-Ray diffraction instrument

Product Description

 Y3000 Series diffractometer is designed for materials reserarch and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.

•The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.

• High precision diffraction angle measurement system obtains more accurate results

• High stability of the X-ray generator control system gets more stable repeatability precision

• Programmable operation, integrated structure design, easy operation, elegant outlook.

X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:

• Unkown samples in a variety of phase identification

• Mixed samples with known quantitative phase analysis

• Crystal structure analysis

• Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)

•Analysis on material surface film

•Analysis on metal material texture and stress

Technical Parameter

 

XRD-Y3000

Rated power

3kW

 

Tube voltage

 

10-60kV

 

Tube current

 

5-80mA

X-ray tuble

glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW

 

Focus size

 

1 x 10mm or 0.4 x 14mm or 2 x 12mm

Stability

≤0.01%

Goniometer structure

Horizontal ( θ-2 θ)

 

Radius of diffraction

 

185mm

Scanning range

0-164

Scanning speed

0.0012° - 70° min

Max. revolving speed

100° /min

Scanning fashion

θ-2θ linkage, θ,2θ single action; continuous or stepping scanning

Angle repeatable accuracy

1/1000°

Minimal stepping angle

1/1000°

 

Detector

 

proportional counters(PC) or scintillation counters(SC)

Maximal counting rate of linearity

5 x 105CPS ( with the compensate function of drop out counting )

Energy resolution ratio

≤25% (PC),≤50% (SC)

Counting fashion

differential coefficient or integral, PHA automatically, Dead time regulate

Stability of system measure

≤0.01%

Scattered rays dose

≤1 μ Sv/h ( without X-ray protective device )

Instrument integrative stability

≤0.5%

Figure size

1100 x 850 x 1750mm

 

Detailed Images

 

 DW-XRD-Y3000 xrd x-ray diffractionDW-XRD-Y3000 xrd x-ray diffractionDW-XRD-Y3000 xrd x-ray diffraction

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FAQ

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