Introduction

X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
Computer software , consisting diffractometer with special functions .

Features:

Technical parameters:

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