Patent MDA2000R portable USB digital microscope with reticl measurement function for metal parts quality inspection
Negotiable /Piece
Min.Order:50 Pieces
Hangzhou Future Optics Sci & Tech Co., Ltd.
♦Features:
1. Digital imaging module:2.0MP high performance CMOS imaging module;
2. Imaging software: Future Win Joe image & movie capturing and processing program
3. Optical conjugation imaging module: One set of lenses offers two optical magnifications: 2.5X and 0.4X;
4. Zoom and focus mechanism: Big focus wheel and double helix rail design offers smooth and fine adjustment of focus;
5. Uniform illumination part: Falling–in ring–lighting panel with 8 LED lamp.
6. Calibration ruler: 0.1mm/10mm calibrating slide.
♦Applications:
To measure the fine size which you cannot measure with a vernier scale and to check the tiny defects you cannot find by your human eye.
To measure the size of a tiny gap of a metal camera adapter and to take pictures of the metal camera surface texture for evaluation of quality, including surface roughness, contour, form, waviness and defects.
Calibration:
With a 10mm/ 0.1mm glass micro ruler (Figure 1), to calibrate the movable reticle of the software (Figure 2).
Figure 1 A 10mm / 0.1mm ruler Figure 2 A movable reticle of Future Win Joe
Figure 3 Calibration of vertical line at 40X Figure 4 Calibration of vertical line at 240X
To measure the narrow gap size with the reticle calibrated at the same setting of magnification 40X (The settings of image resolution and screen display resolution keep unchanged). By moving the microscope with your hand and to draw the position of reticle with your PC mouse you can have the vertical line of reticle cover the tiny gap, and read out the divisions, the width of gap = 4.0 *0.072=0.288mm (See E-area of Figure 5).
Figure 5 Picture of a metal part with a narrow gap at 40X
Improvement of image:
In order to capture a clear image of this shiny surface metal part, you need to adjust the setting of exposure time and the setting of Gamma value in software of Future Win Joe to cut away the noise background. You also need to have your metal part be apart from a shiny background material (See D-area of Figure 5, the distinct border between the metal part and the background of a cloth), and to take a picture not containing a shiny point (see B-area of Figure 5). In order to get a wider depth of field, you must capture your image at low power (See C-area of Figure 5).
Inspection in low power and high power:
You can find the defect area in 3D viewing at 40X (See A-area of Figure 5).By turning the focusing wheel to let the lens move down to the metal part, you can get a high magnification (240X) position to view the detail of surface roughness (See Figure 6:F-area of Figure 5 amplified ). Of course you can measure the interval of two adjacent waviness lines: the width of waviness =3.0 *0.019 =0.057mm,
Figure 6 Close view of waviness of the metal part at 240X
♦Detail Specifications:
Capture Mode | Picture and Video |
Sensor Parameter | 1/3.2” 2.0MP Color CMOS |
Max. Resolution | 1600*1200 |
Pixel Size | 2.8µm*2.8µm |
Sensitivity | 1.0V / lux-sec |
Dynamic Range | 71.0 dB |
S/N Ratio | 42.3 dB |
Working Distance | 5.0MM ---∞ |
Division of calibration ruler | 0.1mm |
Magnification | 1---40X; 240X |
Spectral Range | 400-650nm(with IR-filter) |
Frame Rate | 7.5fps@1600*1200 |
Preview Model | 1600*1200;1280*1024; 640*480; 320*240 |
Exposure | ERS or Manual |
Power Consumption. | 348 mW |
White Balance | ERS or Manual |
Out Interface | USB2.0 |
Device Size | Φ45mm*95mm |
Device Weight | 0.12kg |
System Compatibility | 32bit and 64bit, XP, Vista, Win7,Win8, Mac |
Language of software | English, French, German, Spanish, Japanese, Chinese, Russian
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