EC-770,magnetic paint thickness gauge,F-Probe & N-Probe
Negotiable /Piece
Min.Order:20 Pieces
Xiamen Wellzion Electronics Co., Ltd.
Model | EC-770 | EC-770F | EC-770N |
Probe | F-Probe & N-Probe | F-Probe | N-Probe |
Measuring principle | Magnetic induction & Eddy Currents | Magnetic induction | Eddy Currents |
Measuring range | 0 to 1300um (0 to 51.2mils) | ||
Accuracy | ± (3%+2um) ± (3%+0.078mils) | ||
Resolution | 0um~999um(1um) 1000um~1300um(0.01mm) 0mils~39.39mils(0.01mils) 39.4mils~51.2mils(0.1mils) | ||
Calibration | One point to four point calibration, zero point calibration, Basic | ||
Data group | One direct group(readings not be stored to memory) Four general group(readings will be stored automatically) NOTE: each group have individual statistics, alarm limit settings and calibration | ||
Statistics | No. of readings, mean, minimum, maximum and standard deviation | ||
Units | um , mm, mils | ||
Alarm | User can set the high/low alarm limit Alarm icon displayed on LCD when over the limit | ||
Minimum curvature radius convex | 1.5mm | ||
Minimum curvature radius concave | 25mm | ||
Minimum measuring area | Diameter 6mm | ||
Minimum thickness of substrate | F-probe: 0.5mm(0.02"), N-probe: 0.3mm(0.012"); | 0.5mm(0.02") | 0.3mm(0.012") |
Maximum measuring rate | Two readings per second | ||
Computer interface | Download data via USB | ||
Power supply | Two 1.5V AAA battery | ||
Operation environment | Temperature: 0 to 40°C(32 to 104°F); humidity: 20% to90%rh | ||
Storage environment | Temperature: -20 to 70°C(-4 to 158°F) | ||
Standard Compliance | ROHS WEEE | ||
Dimensions | 110mm*53mm*24mm(4.33"*2.09"*0.94") | ||
Case Material | ABS; 92g(3.24 oz) |
Original menu design
Because of menu design, operation more easy to learn, faster to use
Real-time recording, ensure data integrity
Unique software designed to make data analysis more reliable
Functions | Magnetic | Eddy Current |
Magnetic properties | √ | |
Electrical properties | √ | |
Curvature radius | √ | √ |
Substrate thickness | √ | √ |
Size of measuring area | √ | √ |
Position and shape | √ | √ |
Surface roughness | √ | √ |
Sample deformed | √ | √ |
Adhesive substances | √ | √ |
Strong magnetic field | √ | |
Temperature and humidity | √ | √ |
Measuring operations | √ | √ |
Low battery | √ | √ |
Probe wear | √ | √ |