IEC60335-2-14 Jointed Test Finger with 125mm Stop face
1. Introduction
Test Probe B (Jointed Test Finger) is designed according to IEC61032 figure 2, and can meet the test requirements of IEC60529 and IEC60065. The probe consists by dactylogryposis and handle. The dactylogrypossis has two active joints that can bend in 90 degrees. The finger part is made of steel material, the handle is made of nylon, and has a terminals of M6 threaded hole to work with force gauge. Or the probe can built-in 50N thruster to apply appropriate force directly during the test. The test probe B is to simulate the person’s finger, to evaluate the protection of person’s finger from hazard parts (Live parts or mechanical parts) of enclosure. Test probe B is the IP code probe for IP2X testing.
2. Specification
Model | PG-TPB-2 |
Jointed point size 1 | 30±0.2 |
Jointed point size 2 | 60±0.2 |
Length of finger | 100±0.2 |
Fingertip to baffle size | - |
Fingertip taper fillet | S4±0.05 |
Diameter of finger | Ф12 0 -0.05 |
Diameter of baffle | Ф125±0.2 |
Thickness of baffle | - |
A-A section diameter | - |
A-A section width | - |
Thruster | 10N optional |
Standard | IEC60335-2-14 |
