High Precise Short Wavelength X-ray Diffractometer
(Model:TPXRD-01)
Application
Light Alloy and Its Processing
Structural Strength of Metal Components
Rolled Sheet Steel
Ceramic Materials and Processing
Silicon Materials and Processing
Archaeological and Cultural Relics Identification
Power Equipment
And, under the requirement of not destroying the sample and workpiece, the crystallographic diffraction analysis of the internal substance
Technical parameters
Maximum measurable thickness: 40 mm (aluminum)
70mm (magnesium)
8mm (titanium)
4mm (steel)
Measured Volume: 0.1mm * 0.4mm * 1.0mm~6.0mm
The measurement error of (111) crystal plane spacing of aluminum powder standard sample is less than (±0.0006A)
The error of stress measurement is less than ±25 MPa
Features
Non-destructive determination of residual stress and its distribution in rolled light alloy plate, can be used to optimize rolling and heat treatment processes.
Non-destructive testing of the phase, texture and stress of composite coatings and other related to crystal structure and its changes, can be used to optimize the coating process.
Non-destructive testing of internal stress and its distribution in single crystal silicon, can be used to optimize the heat treatment process of single crystal silicon and the processing process of single crystal silicon wafer.
Detection and analysis of the internal phase of cultural relics ,can be used for archaeological and cultural relics identification.
Crystal diffraction plays a cornerstone role in science and technology in the 20th century. It also promotes the birth and development of X-ray diffraction and other crystal diffraction analysis detection techniques and instruments, promotes the development of solid science and technology. It is widely used in basic research and material engineering, surface engineering, chemical engineering, mechanical engineering and other fields.
Existing X-ray diffractometers can only be used to detect and analyze the crystal structure and its changes of material about 10 microns on the surface of a workpiece or sample. The development of neutron diffractometer has solved the scientific and technological problems of non-destructive testing and analysis of the crystal structure and its changes (such as internal stress, internal phase, internal texture, etc.). However, the neutron diffractometer needs a nuclear reactor that can produce high flux neutrons as a neutron source, which makes it difficult to popularize and apply the instrument and its technology in general countries and enterprises.
We have been working hard for many years, taking advantage of the strong penetration of short-wavelength X-rays, based on the principle of "wave-particle duality" of light, relying on innovative optical design, unique X-ray monochrome technology, advanced mechanical and electronic control technology and new analysis and calculation software, solving the engineering technical difficulties of nondestructive testing of crystal structure and its changes of internal substance (such as internal stress, internal phase, internal texture, etc.) in workpiece or sample. We have bring about TPXRD-01 short-wavelength X-ray diffractometer, providing enterprises non-destructive testing and analysis for internal stress, internal phase, internal texture and its distribution of workpiece or sample.
Chongqing TOP Oil Purifier Co., Ltd
Located at Chongqing city--a southwest electromechanical manufacturing center as well as national municipality, Chongqing TOP is a professional leading manufacturer and supplier of oil purifiers and various related testers. Our company consists of departments respectively for technological development, machinery manufacture, instrument manufacture and quality control etc. On basis of mature development and manufacture technology and highly qualified production management team, the products have high quality, easy operation, excellent performance and long service life.