IEC60884-1 1N & 20N Test Probes for socket-outlet no-accessibility of live parts test gauges through shutters

1. Introduction：

The probes are designed according to IEC60884-1 figure 9 and figure 10. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection. 

2. Specification: