Digital Microscope Scanning Electron Microscope

Digital Microscope Scanning Electron Microscope

USD $10,000 - $80,000 /Set

Min.Order:1 Set

Supply Ability:
30 Set / Sets per Month
Port:
Shanghai
Payment Terms:
T/T Credit Card

Quick Details View All >

Brand Name:
Jinyibo
Place of Origin:
Jiangsu, China
Model Number:
DJ-SEM60

Wuxi Jinyibo Instrument Technology Co., Ltd.

Business Type: Trading Company
Main Products: XRF Spectrometer ,Air Micrometer ,X-ray Diffractometer ,ICP Spectrometer

Product Details

 

Product Description

 DJ-SEM60 Scanning Electron Microscope

 Small footprint

Magnification:30X~60,000X

Resolution:15nm

SE Detector+BSE Detector

Powerful software

Easy to use

Easy to maintain

 

Specification:

Magnification Max 60,000X;

Signal Detection: SE Detector+BSE Detector;

Accelerating Voltage:1kV to 30kV,High image resolution;

EDS for component analysis is optional;

Installation a cooling stage, to measure aqueous samples without pretreatment;

Tilt-axis : 0~45°( optional)

 

Features:

1.  X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm / Tilt-axis : 0~45°

2.  Accelerating Voltage:5kV to 30Kv, High image resolution

3.  Installation a cooling stage to measure aqueous samples without pretreatment.

4.  The CCD camera is mounted to view the inside of the stage.

5.  4 step variable sleeve aperture, High-resolution images can be provided by adjusting the beam size.

6.  Automatic focus, automatically adjust the contrast and brightness, adjust the electron beam size, eliminate astigmatism.

7.  Large sample chamber, to observe a wide variety of sample, optional EDS, BSE, motor    control stage and other accessories.

 

Parameter:

Model

DJ-SEM60

Resolution

15nm (30kV, SE Image)

20nm (30kV, BSE Image)

Magnification

30X-60000X

Acceleration voltage

1kV to 30kV (1kV/5kV/10kV/15kV/20kV/30kV -6 step)

Signal Detection

(SEI)-Secondary Electron Image

(BSEI)-Backscattered Electron Image (Option)

* Multi Detector (SE+BSE)

Observation mode

Standard Mode

Charge-up reduction mode

Electron gun

Filament type

Pre centered tungsten filament cartridge

Bias voltage system

Automatic mode

Electron gun alignment

Manual mode

Lens system

Focus Lens

2-stage Electromagnetic Condenser Lens

Objective Lens

1-stage Electromagnetic Objective Lens

Detector type

SE Detector/ BSE Detector

Stage System

Stage Traverse

5-axis System, X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm/ Tilt-axis : 0~45°

Or 3-axis System, X, Y-axis : 40mm / R-axis : 360°

Image shift

Image shift X, Y Image Shift (±150um)

Max Sample size

70mm in diameter, 30mm in height

Image Scanning system

(Fast Scan): 320x240 (Scan time: 0.1sec.)

(Slow Scan): 640x480 (Scan time: 3 sec.)

1(Photo Mode 1): 1280x960 (Scan time: 30 sec.)

2(Photo Mode 2): 2560x1920 (Scan time: 60 sec.)

3(Photo Mode 2): 5120x3840 (Scan time: 120 sec.)

Automatic Function

Auto start, Auto focus, Auto Brightness/Contrast

Image format

BMP, JPEG, PNG,TIFF

Data display

Magnification, Detector type, Accelerating Voltage, Vacuum mode, Logo(Text), Date and time, Text marker, scale bar etc.

Vacuum system

Fully Automatic Multi mode
Rotary Pump/100Liters/min
Turbo Molecular Pump/ 80Liters/sec
pump down time: less than 2minutes

Control unit system

Mouse, Keyboard

PC

PC: Desktop
OS: Microsoft Windows 7
CPU: Intel Core TM i5 or High version
Memory/HDD: 4GB / 500GB or High version

USB 2.0

Software function

Image file open, edit, save 
Length, area, angle measuring
parameter initialization, Image capture mode conversion, Archives, Setting (EDS)

Volume

Main Unit-410(W)×660(D)×600(H)mm……1set

External vacuum pump: -400(W)×160(D)×340(H)mm …1set

Weight

105kg

Equipment environment

Temperature:15℃~30℃
Humidity: 70% or less
Power source: Single phase 100~240V AC, 1KW, 50/60Hz

 Digital Microscope Scanning Electron Microscope

Packaging & Shipping

Digital Microscope Scanning Electron Microscope 

After-Sales Service

Digital Microscope Scanning Electron Microscope 

Buyer Feedback

Digital Microscope Scanning Electron Microscope 

Company Information

Digital Microscope Scanning Electron Microscope 

Trade Shows

Digital Microscope Scanning Electron Microscope 

Certifications

Digital Microscope Scanning Electron Microscope 

Contact

Digital Microscope Scanning Electron Microscope 

 

Contact Supplier

You May Like

New Products

Recommended Products

View More View Less

Find Similar Products By Category

Measurement & Analysis Instruments > Other Measuring & Analysing Instruments
Categories
Hi~