Energy Dispersion X-ray Fluorescence Spectrometer
Working principle
The original X-ray produced by X-ray tube and high voltage is irradiated on the sample after being properly filtered by the optical filter. The characteristic X-ray (called X-ray fluorescence) of the elements contained in the sample is stimulated. X-ray fluorescence spectra were obtained by using X-ray detectors with high energy resolution. Different elements formed different spectral peaks on the spectra.The strength of the spectral peak is directly proportional to the content of elements in the sample. The energy spectrum detected by the detector is analyzed by the computer. The types of elements contained in the sample are qualitatively analyzed by the position and shape of the spectral peak.
Application
DW-NP-5010A energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.
Introduction
DW-NP-5010A energy dispersive XRF has very wide application. It can do qualitative, quantitative and no sample analysis. Such as block sample, powder or liquid samples, from the 4th element in the periodic table beryllium (Be) to the 92rd element uranium (U), almost all of the elements can be accurately analyzed. The analytical concentration range can be from 0.1 PPM to 100%, and even up to 100% of the elementconcentration can be directly measured without dilution.XRF analysis method has the advantages of simple sample preparation, wide determination range of elements, high determination accuracy, good reproducibility, fast measurement speed (30s-900s), no environmental pollution and no destruction of samples.
Main component and technical parameters
1. Si(PIN) or SDD detector
Resolution< 145eV (The lower the resolution, the higher the sensitivity.)
Counting rate> 1000/S
Crystal area> 15mm2
Beryllium window thickness = 0.025mm
Detector power< 1.2W
Number of channels: 2048 channels
3. Power controller
System power control: +5 VDC at 250 mA (1.2 W)
Constant cooling control: 400 VDC
4. X ray tube
5. High voltage generator
Input: 85~265VAC,47~63Hz,Power factor correction.
1kV~5kVcomply to UL85~250VAC input standard
Voltage variation: 0.01% of output voltage from no load to full load
Current variation: 0~rated power, 0.01% of output current
Ripple: Peak - peak of output voltage 0.25%
Temperature variation: voltage or current setting, 0.01%/oC
Stability: 0.05%/8h after warming-up for half an hour
6. Automatic filter conversion system
Filters are automatically selected and converted(filter function:The energy spectrum component of the excitation line can be improved to suppress the strong X-ray fluorescence of high content components and improve the measurement accuracy of the elements to be measured.)
Newly designed and specially treated X-ray tube with low-radiation
Fully enclosed lead plate double shield design
Automatic filtering device for lead plate
X - ray interrupters in case of sample unexpected cover opening
Delay testing and X-ray warning system
8. The detection limit of harmful elements Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction
Detection limit (Cd,Pb,Cr,Hg,Br): 2ppm
9. Powerful analysis software workstation
One-touch operation software, simple and easy to use, user does not need professional knowledge.
Ergonomic human-machine interface
Operators do not need to set various test parameters, powerful customized report function..
Test data is automatically stored with historical query function
The most advanced qualitative and quantitative analysis method.
Dozens of elements can be analyzed simultaneously.
10. Technical parameter
Model | DW-NP-5010A | ||
Analysis principle | Energy dispersive X-ray fluorescence analysis | ||
Element measuring range | Any element from Na(11)-U(92) | ||
Min. measuring limit | Cd/Hg/Br/Cr/Pb≤2 ppm | ||
Sample shape | Arbitrary size, any irregular shape | ||
Sample type | Plastic/metal/film/powder/liquid etc | ||
X ray tube | Target material | Mo | |
Tube voltage | 5-50KV | ||
Tube current | 1-1000uA | ||
Sample exposure diameter | 2, 5, 8mm | ||
Detector | Si-PIN or SDD detector, high speed pulse height analysis system | ||
High voltage generator | Special HV generator for X fluorescence | ||
ADC | 2048 channels | ||
Filter | 6 filters are automatically selected and converted. | ||
Sample observation | 200×color CCDcamera | ||
Analysis software | Patented software products, free upgrade for life | ||
Analysis method | Theoretical α coefficient method,basic parameter method, empirical coefficient method | ||
Analysis time | 30-900seconds, adjustable | ||
Operating system software | WINDOWS XP | ||
Dataprocessing system | Host | PC business model | |
CPU | ≥2.8G | ||
Memory | ≥2g | ||
CD-ROM | 8xDVD | ||
Hard disk | ≥500G | ||
Display | 22’’ or 24’’ LCD display | ||
Working environment | Temperature 10-35C,humidity 30-70%RH | ||
