DW-XRD-Y3000 Model X-ray diffraction instrument
Y3000 Series diffractometer is designed for materials reserarch and industrial products analysis. It is the perfect combination of
conventional analysis with special-purpose measurement products.
•The perfect combination of hardware and software systems meets the needs of academics and researchers in different
application areas.
• High precision diffraction angle measurement system obtains more accurate results
• High stability of the X-ray generator control system gets more stable repeatability precision
• Programmable operation, integrated structure design, easy operation, elegant outlook.
X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:
• Unkown samples in a variety of phase identification
• Mixed samples with known quantitative phase analysis
• Crystal structure analysis
• Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)
•Analysis on material surface film
•Analysis on metal material texture and stress
XRD-Y3000 | |
Rated power | 3kW |
Tube voltage |
10-60kV |
Tube current |
5-80mA |
X-ray tuble | glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
Focus size |
1 x 10mm or 0.4 x 14mm or 2 x 12mm |
Stability | ≤0.01% |
Goniometer structure | Horizontal ( θ-2 θ) |
Radius of diffraction |
185mm |
Scanning range | 0-164 |
Scanning speed | 0.0012° - 70° min |
Max. revolving speed | 100° /min |
Scanning fashion | θ-2θlinkage, θ,2θsingle action; continuous or stepping scanning |
Angle repeatable accuracy | 1/1000° |
Minimal stepping angle | 1/1000° |
Detector | proportional counters(PC) or scintillation counters(SC) |
Maximal counting rate of linearity | 5 x 105CPS ( with the compensate function of drop out counting ) |
Energy resolution ratio | ≤25% (PC),≤50% (SC) |
Counting fashion | differential coefficient or integral, PHA automatically, Dead time regulate |
Stability of system measure | ≤0.01% |
Scattered rays dose | ≤1μ Sv/h ( without X-ray protective device ) |
Instrument integrative stability | ≤0.5% |
Figure size | 1100 x 850 x 1750mm |
