IEC61032 test finger probe B
Bending test (Test probe D) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances
IP4X Test Probe is designed according to IEC61032 figure 4, meet the requirements of IEC60529-IP3,IEC60065,IEC60598 and etc. This wire is intended to verify the protection of persons against access to hazardous parts. It is used to verify the protection against access with a wire.
Test Figure B
Used Method
Note
Test probe is precision stainless steel products, please use of gently and pay attention to maintenance
IEC60335
Knurled Finger Diameter: 12mm
Knurled Finger Length: 80mm
Baffle Plate Diameter: 50mm
Baffle Plate Length:100mm
Baffle Thickness: 20mm
Product picture | Reference Standard | Specification |
IP1X Test Probe A | IEC60529 IEC61032 IEC60335 IEC61029 IEC60745 IEC60065 IEC60950 | Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm |
IP2X Test Probe B | IEC61032 IEC60950 IEC60335 IEC60529 IEC60045 IEC60884 IEC60745 | Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
IP3X Test Probe C | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
IP4X Test Probe D | IEC61032 IEC60529 | Test Probe Length:100mm Test probe Diameter:1.0mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm |
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