Test finger probe C/D with 3N 1N force laboratory test equipment
Test finger probe C/D with 3N 1N force laboratory test equipment
Test finger probe C/D with 3N 1N force laboratory test equipment

Test finger probe C/D with 3N 1N force laboratory test equipment

USD $115 - $300 /Piece

Min.Order:1 Piece

Supply Ability:
100 Piece / Pieces per Month
Port:
shenzhen
Payment Terms:
T/T Credit Card

Quick Details View All >

Brand Name:
BND-D
Place of Origin:
Guangdong, China
Model Number:
TEST PROBE D with force

Shenzhen Bonad Instrument Co., Ltd.

Credit Member 4 years
Business Type: Buying Office
Main Products: Gas Analyzers

Product Details

Product Description

Test finger probe C/D with 3N 1N force laboratory test equipment

Bending test (Test probe D) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

 

IP4X Test Probe is designed according to IEC61032 figure 4, meet the requirements of IEC60529-IP3,IEC60065,IEC60598 and etc. This wire is intended to verify the protection of persons against access to hazardous parts. It is used to verify the protection against access with a wire.

 

 

Test finger probe C/D with 3N 1N force laboratory test equipment

 

 

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

 

Reference Standard

 

IEC60335

 

Specification

 

Test Probe Length:100mm

Test probe Diameter:1.0mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

Detailed Images

 Test finger probe C/D with 3N 1N force laboratory test equipment

 

Test finger probe C/D with 3N 1N force laboratory test equipment

 

Packaging & Shipping

 Test finger probe C/D with 3N 1N force laboratory test equipment

Test finger probe C/D with 3N 1N force laboratory test equipment

Related Products

 

Test finger probe C/D with 3N 1N force laboratory test equipment

 

Product picture

Reference Standard

Specification

 

IP1X Test Probe A

IEC60529   IEC61032 IEC60335

IEC61029   IEC60745 IEC60065

IEC60950

Ball Diameter:50mm

Baffle Plate Diameter:45mm

Baffle Plate Thickness:45mm

Handle Diameter:10mm

Handle Length:100mm

 

IP2X Test Probe B

IEC61032 IEC60950   IEC60335

IEC60529 IEC60045   IEC60884

IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

IP3X Test Probe C

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:2.5mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

IP4X Test Probe D

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:1.0mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

Company Information

Our factory

 

Test finger probe C/D with 3N 1N force laboratory test equipment

 Test finger probe C/D with 3N 1N force laboratory test equipment

Contact Supplier

Mobile
12348663650

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