Product Details

iec standard fig 1 IP1X with 50n force test finger probe A

Brand Name BND-A
Place of Origin Guangdong, China
Model Number TEST PROBE A

Product Features

 

Specification

iec standard fig 1 IP1X  with 50n force test finger probe A

IP1X Probe A /Test Probe A
1, According to : GB/T4208-2008 / IEC 61032:1997 / IEC 60529:2001 and UL
2, IP1X Probe A (Test Probe A) is necessary appliance for household and similar electrical appliance of against electric shock protection test.

 

Technical Parameters:

1. Ball Diameter: 50mm
2. Total Length: 210mm
3. Baffle Plate Diameter: 45mm
4. Baffle Plate Thickness: 4mm
5. Handle Diameter: 45mm
6. Handle Length: 95mm
7. According to IEC 61032 figure 1 (the Test probe A), table 6 GB/T4208-2008 the first characteristics (1)

 

Application:
1, Sphere can not touch the live parts or close to the dangerous parts.
2, In the testing requirements of keep close to the dangerous part, the test steel ball without thrust need to be used with push tension meter, and steel body for protective coating need to apply to 50 N thrust.

 

 

iec standard fig 1 IP1X with 50n force test finger probe A

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

 

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

 

Application
  • The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.
  • Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.

 

Detailed Images

 

 iec standard fig 1 IP1X with 50n force test finger probe A

 

Packaging & Shipping

 iec standard fig 1 IP1X with 50n force test finger probe A

Related Products

 

iec standard fig 1 IP1X with 50n force test finger probe A

 

Product picture

Reference Standard

Specification

 

 

IP1X Test Probe A

IEC60529   IEC61032 IEC60335

IEC61029   IEC60745 IEC60065

IEC60950

Ball Diameter:50mm

Baffle Plate Diameter:45mm

Baffle Plate Thickness:45mm

Handle Diameter:10mm

Handle Length:100mm

 

IP2X Test Probe B

IEC61032 IEC60950   IEC60335

IEC60529 IEC60045   IEC60884

IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

IP3X Test Probe C

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:2.5mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

IP4X Test Probe D

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:1.0mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

Company Information

Our factory

 

iec standard fig 1 IP1X with 50n force test finger probe A

 

You May Like

Find Similar Products By Category

You May Like

View More
Chat Now Contact Now