Product Details

iec 61032 test sphere probe with stop plate

Brand Name BND-A
Place of Origin Guangdong, China
Model Number TEST PROBE A

Product Features

Product Description

Ball Accessibility Probe with Handle 50 mm.iec 60335 IP1 For impact and access testing.

 

Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

 

iec 61032 test sphere probe with stop plate

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

 

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

 

Application
  • The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.
  • Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.

 

Reference Standard

 

IEC61032 IEC60950 IEC60335

IEC60529 IEC60045 IEC60884

IEC60745

Specification

 

Ball Diameter:50mm

Baffle Plate Diameter:45mm

Baffle Plate Thickness:45mm

Handle Diameter:10mm

Handle Length:100mm
Detailed Images

 iec 61032 test sphere probe with stop plate

 

Packaging & Shipping

 iec 61032 test sphere probe with stop plate

 

Related Products

 

iec 61032 test sphere probe with stop plate

 

Product picture

Reference Standard

Specification

 

 

IP1X Test Probe A

IEC60529   IEC61032 IEC60335

IEC61029   IEC60745 IEC60065

IEC60950

Ball Diameter:50mm

Baffle Plate Diameter:45mm

Baffle Plate Thickness:45mm

Handle Diameter:10mm

Handle Length:100mm

 

IP2X Test Probe B

IEC61032 IEC60950   IEC60335

IEC60529 IEC60045   IEC60884

IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

IP3X Test Probe C

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:2.5mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

IP4X Test Probe D

IEC61032   IEC60529

Test Probe Length:100mm

Test probe Diameter:1.0mm

Dam-sphere Diameter:3.5mm

Handle Diameter:10mm

Handle Length:100mm

 

Company Information

Our factory

 

iec 61032 test sphere probe with stop plate

 

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