iec 61032 test probe in instrument parts& accessories

IEC61032 The Standard Test Finger Probe

Article NO.: BND-B

specification:

The Standard Test Finger Probe / The Standard Test Knurled Finger Probe / Test Probe B / IP2X Protection Grade Probe

Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

5According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1

Application:

1, The joint part of  The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and 50 mm to 20 mm baffle plate cannot enter.

2, In the prevent electric shock test, wires , power devices, and lighting devices are needed.

3Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Tolerance on dimensions when no specific tolerance is given:

– on angles: 0

−10°
– on linear dimensions: up to 25 mm: 0

− 0,05 mm; over 25 mm: ± 0,2 mm.

Note : The Test Probe is made of precision stainless steel products, take and put down slightly when using, and pay attention to maintenance