IEC60950 IEC61032  IEC60884 IEC test finger probes A/B/C/D IP2X lab testing

This is the “International” test finger required by most IEC61032 test probe B, EN Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements with integral palm simulator. The handle and stop face are made of nylon.  Finger is made of stainless steel. All parts precision machined.

• BND-A: Conform to the IEC60335-1 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 50 mm, instead of the non-circular face.

• BND-B: Conform to the IEC60335-2-14 clause 20.2. Means of a test probe that is similar to test probe B of IEC 61032 but having a circular stop face with a diameter of 125 mm instead of the non-circular face, the distance between the tip of the test finger and the stop face being 100 mm.

Using methods:

1,The joint portion of Standard test finger can not touch the live parts or hazardous parts ,and it can’t enter 20mm-50mm baffles

2,Prevent access to dangerous parts of the test requirements, Test B need to bring 30 ± 3N thrust. Usually use with force gauge

3,In the electric shock test, we need to wire and configure the power supply(mains), the lamp unit.

Note

Test probe is precision stainless steel products, please use of gently and pay attention to maintenance

IEC61032 IEC60950 IEC60335

IEC60529 IEC60045 IEC60884

IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

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