All-in-One Lab Atomic Force Microscope
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer's requirements in accuracy and scan size;optical observation system for tip check and sample positioning.CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.Features
1. Integrated scanning probe and sample stag enhanced the anti-interference ability.
2. Precisionlaser and probe positioning device make changing the probe and adjusting thespot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.
4. Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5. Sample scanning area of interest could freely moved by using the designof high precision sample mobile device.
6. CCD observation system with opticalpositioning achieves real-time observation and positioning of the probe samplescan area.
7. Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8. Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9. Spring suspension which simple and practical enhanced anti-interference ability.
Main technical parameters
| Work mode | FM-tapping, optional contact, friction, phase,magnetic or electrostatic. |
| Size | Φ≤90mm,H≤20mm. |
| Scanningrange | 20mmin XY direction,2mmin Z direction |
| Scanningresolution | 0.2nm in XY direction,0.05nmin Z direction. |
| Movementrange of sample | ±6.5mm. |
| Pulse width of the motor approaches | 10±2ms. |
| Image sampling point | 256×256,512×512. |
| Opticalmagnification 4X | optical resolution 2.5mm |
| Scanrate 0.6Hz~4.34Hz | scanangle 0°~360° |
| Scanningcontrol | 18-bit D/A in XY direction,16-bit D/A in Z direction. |
| Datasampling | 14-bitA/D,double16-bit A/D multi-channel synchronous sampling |
| Feedback | DSP digital feedback. |
| Feedbacksampling rate | 64.0KHZ. |
| Computerinterface | USB2.0. |
| Operatingenvironment | Windows98/2000/XP/7/8. |
Packaging & Shipping
Shipping : 3-10days after payment received
Package : Wooden case package
FAQ
| 1.How to choose the correct Atomic Force Microscope ? Please send us your purpose,we will give you correct suggestion,divided into Teaching purpose and Scientific research purpose. |
| 2.What is standard work mode? Touch mode and Tapping mode are standard configuration.Others like friction, phase,magnetic or electrostatic are optional |
| 3.What is payment terms ? We accept 100% prepay by T/T,Western Union,Money Gram,L/C |
| 4.What is your gurantte? We have 1year gurantte time. |
| 5.If machine broken,how to deal with ? Please open the cargo when you receive it,if broken caused by transporation,claim for express,and at mean time,we will ship you new replace one. |