Measuring microscope with digital encoder reading
Easy operating system
Fully automatic load control
Hardness computation and statistics on LCD
Integral printer
Two optical paths
XY-stage with minimum reading of 0.01 mm

Applications
- Steels, nonferrous metals, IC wafer
- Thin plastic, metallic foils, plating, coating, surface layers,
laminated metals
- Effect of heat treatment and depths of carburized layer and flame
hardened layers


Technical specifications

Vickers scales: HV0.01, HV0.025, HV0.05, HV0.1, HV0.3, HV0.5, HV1
Display conversion to :Rockwell, Brinell

Display: Hardness value 5-digit, diagonal length 4-digit (D1,D2), limits GO/NG, test force, dwell time, no of tests, average, standard dev, regression

Test loads: 10 - 25 - 50 - 100 - 200 - 300 - 500 - 1000gf

Accuracy :conform to EN-ISO 6507 / ASTM E384
Load control Fully automatic (loading/dwell/unload)

Load duration :5 to 99 sec (specified in 1-seconds increments)
Test force selection Dial, automatic change on display
Objective magnification 10x, 40x
Optical path 2-way (microscope/photographic device)
Measuring microscope Electronic
Total magnification 400x (for measurement) 100x (for observation)
Measuring range 200
Minimum reading 0.01
XY stage
Dimensions 100 x 100mm
Travel range 25 x 25mm
Minimum reading 0.01mm
Specimen
Maximum height: 85mm (2.55")
Maximum depth :120mm (3.35") (from the center)
Output: built-in printer (values & statistics), RS232 serial
Light source :Halogen lamp
Power supply :110-220V AC, 50/60 Hz
Dimensions :513 * 320 * 470 mm
Weight: 36kg


Standard delivery
Main unit
Diamond indenter Vickers
Objectives 10x, 40x
Digital eyepiece 10x
XY-stage with micrometers
Built-in printer
RS232 data output
4 adjustable feet
Level gauge
Micro-Vickers test plate
Spare halogen lamp
Fuse
Installation & users manual
WILSON-WOLPERT certificate

Optional accessories
Knoop indenter
Precision vice
Video filar system
Certified indenters
Certified test blocks
See pages indenters and testblocks


Optional system
WHV-CCD system for (semi-)
automatic traverses and
pattern testing by pc support
and motorised XY stage:
see pages 148-149