Specifications

PATA 2.5
Interface standard: 44pin IDE
Density: 8GB-256GB
Support static and dynamic wear-leveling,bad block managemen

SSD-KD-PA25-MJ
Item	Model	SSD-KD-PA25-MJ
General	Form factor	2.5"
	interface	IDE 44pins
Performance	Capacity(GB)	8GB	16GB	32GB	64GB	128GB	256GB
	Sustained Read	30MB/S	66MB/S	67MB/S	65MB/S	67MB/S	67MB/S
	Sustained Write	29MB/S	51MB/S	76MB/S	73MB/S	75MB/S	75MB/S
	Random IOPS	6325
	Average Access time	0.2ms
Storage Media	NAND Flash	MLC(Test Flash:K9GAG08U0M)
Power Consumption	input Voltage	5V± 5%
	Idle	0.7W
	Active	1.8W
Reliability& Endurance	Write endurance	80years@10GBytes write and erase per day at 256GB
	Read endurance	unlimited
	Wear-Leveling Algorithm	Dynamic and static wear-leveling
	Data Retention	10years at 25ºC
	MTBF	1,000,000hours
	ECC	Supports BCH ECC 8bits or 15bits in 512 bytes
	Bad Block Management	Auto Bad Block Management in system
Environment	Operating Temperature	0~70ºC
	Non-operating Temperature	-45~85ºC
	Shock	2,000G(@0.3ms half sine wave)
	Vibration	20G(40-2000HZ)
	Humidity	5-95%
Warranty	2years
Available unit	Available,NO EOL
Testing Platform	Intel Celeron 336 2.80GHz,DDR2 PC2-5300 512MB×2pcs single channel RAM, VIA VT8237A VIA P4M900 Chipset,Microsoft Windows XP Professional SP2
Testing Software	HDBench3.4.0.3, IOMeter 2006.07.27
Physical Dimensions& Weight	Height(mm)	9.5± 0.25
	Width(mm)	69.8± 0.25
	Length(mm)	100.2± 0.25
	Weight(g)	70
The read and write speed is limited to this test platform.