IEC 61032 Test Probe B Standard Jointed Test Finger
USD $1 - $400 /Piece
Min.Order:1 Piece
Shenzhen Chuangxin Instruments Co., Ltd.
IP2X IEC61032 Jointed Finger Probe Test Probe B
Key words: test probe B, Test Finger, finger probe
1.IEC61032 ,IEC60335,IEC60529;
2.jointed test finger probe b;
3.stainless steel made;
4.quality first-competitive price.
Articulated Test Finger (Figure 2 / Test Probe B / IEC 61032)
The Articulated Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also conform to the standards of CSA, IRAM, UL. IEC 60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.
1. The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and 50 mm to 20 mm baffle plate cannot enter.
2. In the prevent electric shock test, wires , power devices, and lighting devices are needed.
3. Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance
Purpose:
This Jointed Test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.
Conforms to:
Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc.
Notes:
Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.
Technical Parameters:
Kunrled finger diameter | 12mm |
Knurled Finger length | 80mm |
Baffle plate diameter | 50mm |
Baffle plate length | 100mm |
Baffle thickness | 20mm |