IEC 61032 Test Probe B Standard Jointed Test Finger
IEC 61032 Test Probe B Standard Jointed Test Finger
IEC 61032 Test Probe B Standard Jointed Test Finger

IEC 61032 Test Probe B Standard Jointed Test Finger

USD $1 - $400 /Piece

Min.Order:1 Piece

Supply Ability:
10000 Piece / Pieces per Month
Port:
Shenzhen
Payment Terms:
Credit Card

Quick Details View All >

Place of Origin:
Guangdong, China
Brand Name:
CX
Model Number:
CX-2B

Shenzhen Chuangxin Instruments Co., Ltd.

Credit Member 4 years
Business Type: Manufacturer
Shenzhen Guangdong China
Main Products: Test Fingers & Probes ,Spring impactor ,Go and IEC60061-3 Not Go Gauge ,Flammability Testing equipment ,Plug and Socket Gauges

Product Details

 IP2X IEC61032  Jointed Finger Probe Test Probe B

 

Key words: test probe B, Test Finger, finger probe

 

1.IEC61032 ,IEC60335,IEC60529; 
2.jointed test finger probe b; 
3.stainless steel made; 
4.quality first-competitive price.


 Articulated Test Finger (Figure 2 / Test Probe B / IEC 61032)

 

The Articulated Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also conform to the standards of CSA, IRAM, UL. IEC 60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.

 

 

1. The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and 50 mm to 20 mm baffle plate cannot enter.

 

2. In the prevent electric shock test, wires , power devices, and lighting devices are needed.

 

3. Both joints shall permit movement in the same plane and the same direction through an angle of 90° with a 0° to +10° tolerance

 

 

Purpose:

This Jointed Test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

 

Conforms to:

Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc.

 

Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

 

Technical Parameters:

IEC 61032 Test Probe B Standard Jointed Test Finger

Kunrled finger diameter12mm                                   
Knurled Finger length80mm
Baffle plate diameter50mm
Baffle plate length100mm
Baffle thickness20mm

 

IEC 61032 Test Probe B Standard Jointed Test FingerIEC 61032 Test Probe B Standard Jointed Test Finger

 

IEC 61032 Test Probe B Standard Jointed Test Finger

Contact Supplier

Mr. hong wu manager Chat Now
Telephone
86-0755-61577692
Mobile
13631576199
Fax
86-0755-61577693
Address
Xi Xiang Hua Qiao Village, Bao an, Shenzhen, China Guangdong

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