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 Overview

The SZT-4 silicon material compound gas tester is composed of both kinds of silicon material testers.

1)  2-range resistance measuring instruments are configured with hand-held four-probe detecting head or seat-type, which can be used to measure flake, columnar or blocky-shaped , semiconductor materials with the resistivity of 0.01 ~ 200 ohms (Customer can choose according to different requirements of different range, the minimum can be measured can be measured 0.0001Ω largest 100000Ω, according to the current file set accuracy)/ PCT. Through adjustment of the constant current source, certain measurement results can be mended. For example, the tested results of ordinary silicon materials must be multiplied by the detecting head correction coefficient of 0.628; the tested results of silicon material thin-thickness diffusion and conductive thin films "block resistance" must be multiplied by the correction factor of 4.53 and so on; and all conditions above can be handled through adjustment of the constant current.

SZT-4 digital type 4-probe tester is very small, operational convenient and range moderate, which is quite suitable for separating of resmelting back materials.

2) P-N polarity determinate meter of Silicon Rectifier France materials shall be configured with 3-probe hand-held probe, which can measure flake-shaped or block-shaped silicon materials with the resistivity of 1000 ~ 0.01 ohms / PCT for determination of its polarity.

Working atmosphert conditions of this intrument is shown as following:

Temperature: 18-25°C

Relative humidity: 50%-70%

There is no strong electric field interference in the working room of this instrument, which is far away from the high frequency equipment.

II Technical parameters

1) measuring range

        (1) resistivity:    0.01-200Ω-cm

       (2) block resistance:   0.01-200Ω-

        (3) resistance: 0.01-200.0Ω

2) digital voltmeter

    (1)  measuring range  200mV single range

    (2) deviation: reading ±0.2%±3charater

    (3) input resistance     >10MΩ

3) constant current source

(1) electric current output     0~10mA continuously adjustable   

(2) measuring range:       1mA, 10mA

(3) deviation:     reading ±0.2%±3charater

4) hand-held type 4-probe test head

(a)probe space: 1mm

 (b)probe machinery vacillation rate:  ±1.0%

 (c)probe material:High-speed needle ( if you need we also can change this into tungsten carbideφ0 )

 (d) pressure:less than 2kgs

(5) Conductive type discrimination

The silicon materials with the resistivity of 1000-.0.01 ohms / cm, which is used as conductive materials may be measured, and the tested material can be indicated as the “readulterated material” by means of sound and light alarm