Biwin wholesale cheap 128GB Compact Flash Card CF Card SSD Hard Drive
1.Product Specifications of 128GB Compact Flash Card SSD Solid State Drive
| Product Code | F6107 |
| Interface | CF-50PIN |
| Flash | MLC |
| Density | 8GB/16GB/32GB/64GB/128GB |
| Max Transfer Performance (Varies by density) | Read: 110MB/s Write: 90MB/s |
| ECC | BCH ECC 72 bits/1KB |
| Operating Voltage | +3.3V(±5%) |
| Power Consumption (Varies by density) | 0.1W(idle) 1W(active) |
| Operating Temperature | 0-70℃ |
| Storage Temperature | -40-85℃ |
| Humidity | 5%-95% |
| MTBF | 2,000,000 Hours |
| Shock | 50(G),11(ms), half-sine wave |
| Vibration | 3.1G(2-500Hz) |
| Dimension(mm) | 36.40x42.80x 3.30mm |
| Weight(g) | ≤12.00g |
2.Product Pictures of 128GB Compact Flash Card SSD Solid State Drive
3.Application of Our Products
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5. Our Factory View
Our factory has full range of product line:
- PCI-E, 2.5”SATA, 2.5”PATA, 1.8”SATA, 1.8”PATA, Half Slim, NGFF, mSATA, mSATA Mini, SATA DOM, PATA DOM, USB DOM
- Memory Card: CFast Card, CF Card;
- Embedded Chips: eMMC, eMCP;
Applicable to harsh operating temperature environments of industrial grade.
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7.Certifications
Biwin has passed ISO 9001 ISO 14001 and been audited by SGS. All of our SSD products are RoHS directive-compliant and carry CE, FCC, RoHS approvals.
We offer all the models with 3 years warranty.
8. Our Services
Reliability Testing:
- High and Low Temperature Storage
- High and Low Temperature Operation
- High and Low Temperature Cycling
- ESD Testing
- Vibration and Shock Testing
- Room Temperature Aging Testing
- Power Failure Testing
State-of-the-art Manufacturing:
- Quality Guaranteed Products
- Strict Quality Control Standards
- Short Lead Time
- Low Product Defect Rate
- Large production Capacity
Wafer Packaging Service:
- First 12" Wafer Packaging Factory in South China
- Include IC Design, Packaging, Testing, Assembling
- Wafer Packaging Products:TSOP 48, QFN, QFP, BGA, LGA, eMMC, UDP.
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